Identification of sorghum parental lines with high phenotypic stability using GGE biplot analysis in Central India
The experimental material was newly developed sorghum parental lines (25 B-lines and 38 R-lines) which were evaluated in RBD in two trials for two consecutive years (2016 & 2017) at research Farm, College of Agriculture, Indore in rainy seasons. The objective of the present study was to identify stable grain sorghum lines and also evaluate them for grain yield and other agronomic attributes (days to 50% flowering, plant height, leaf length, leaf width, leaf area, panicle length) and suitable for kharif season using GGE biplot analysis. Genetic variation was the major contributor for LL, LA and GY in B-lines and PL in R-lines. Variance due to genotype × year interaction effect was a major source of variance for only LL in B-lines.The GE influence was seen only for grain yield in both B- and R-lines. The GY per panicle was high in R-lines (52 to 107g) as compared to B-lines (32 to 79g). Three B-lines (E.Nos. 1, 5, 17) has GY greater than 63g panicle-1 while eight R-lines (I 28, I 32, I 40, I 45, I 47, I 50, I 51 and I 56) had GY greater than 90g panicle-1. Based on mean performance and stability, 1, 14, 7 and 5 were desirable B-lines and I42, I34, I56, I55, RS673 and I26 were desirable R-lines for cultivation and use in further breeding programme over the years.